The Geochemistry/Cosmochemistry group has a JEOL 6500F field-emission scanning electron microscope (SEM), housed in a new microbeam instrument laboratory funded by the American Recovery and Reinvestment Act of 2009. The SEM can produce images of samples in secondary and backscattered electrons with a few nanometer spatial resolution. It is also equipped with a silicon drift detector based Energy Dispersive Analysis (EDS) system for chemical analysis and a state-of-the-art electron backscatter diffraction (EBSD) system for crystallographic analysis, both provided by Oxford Instruments. 

Far left: JEOL 6500F SEM.  Right: Backscattered-electron image of inclusion from a meteorite.  False color EDS-based elemental map of inclusion (Images courtesy Jemma Davidson)Far left:  JEOL 6500F SEM.  Right:  Backscattered-electron image of inclusion from a meteorite and a false color EDS-based elemental map of inclusion.  (Images by Jemma Davidson)