The Geochemistry/Cosmochemistry group has a JEOL 6500F field-emission scanning electron microscope (SEM), housed in a new microbeam instrument laboratory funded by the American Recovery and Reinvestment Act of 2009. The SEM can produce images of samples in secondary and backscattered electrons with a few nanometer spatial resolution. It is also equipped with a silicon drift detector based Energy Dispersive Analysis (EDS) system for chemical analysis and a state-of-the-art electron backscatter diffraction (EBSD) system for crystallographic analysis, both provided by Oxford Instruments.
Far left: JEOL 6500F SEM. Right: Backscattered-electron image of inclusion from a meteorite and a false color EDS-based elemental map of inclusion. (Images by Jemma Davidson)